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Detection service of metal contamination on wafer surface

TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.

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Detection service of metal contamination on wafer surface


TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.


*ICP-MS:Inductively Coupled Plasma- Mass Spectrometer

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0769-22891678

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